Multifunctional Hard X-ray Nanoprobe: The current status and capabilities of XEOL and TR-XEOL

Bi-Hsuan Lin^1*, Xiao-Yun Li¹, Shao-Chin Tseng¹, Chien-Yu Lee¹, Bo-Yi Chen¹, Gung-Chian Yin¹, Shih-Hung Chang¹, Mau-Tsu Tang¹

¹National Synchrotron Radiation Research Center, Hsinchu, Taiwan

* Presenter:Bi-Hsuan Lin, email:bihsuan@nsrrc.org.tw

We have developed successfully the synchrotron based X-ray excited optical luminescence (XEOL) and time-resolved X-ray excited optical luminescence (TR-XEOL) at the TPS 23A X-ray Nanoprobe (XNP) beamline at Taiwan Photon Source (TPS). Not only the XEOL and TR-XEOL, the multifunctional XNP with hard X-ray energy range but also includes other featured methods, such as X-ray fluorescence (XRF), X-ray absorption spectroscopy (XAS), cathodoluminescence (CL), X-ray diffraction (XRD) and Bragg ptychography. Based on the high spatial and temporal resolution, so that the XNP in a single probe can simultaneously obtain the optical, compositional and structural information.
Advanced by energy-tunable hard X-rays, the XNP at TPS provides 40nm spatially resolving means for investigating the optical properties of specific elements in the wide band gap semiconductor materials. An ultrafast streak camera is synchronized with the pulse structure of the synchrotron ring to investigate the dynamics of luminescence of the materials with temporal resolution 30 ps ~ 1.72 μs in the single bunch mode. In parallel to the construction of the XNP endstation, demonstrative XEOL experiments were studied by unfocused X-ray beam at Taiwan Light Source (TLS). Temperature dependent XEOL and polarization-dependent XEOL were used to study the peculiar near-band-edge (NBE) emission of c-plane and a-plane ZnO wafers, respectively. The detail design of the XEOL and TR-XEOL at XNP, and the demonstrative experimental results of a single ZnO microrod and trihalide perovskite CH₃NH₃PbBr₃ will be reported.

Keywords: XEOL, TR-XEOL, ZnO, XAS, XRF